Morphological differences between a bud scar (BS) and circular structure (CS) at the cell surface. In (A, A’), AFM deflection image of an unstressed and of a heat-shocked yeast cell after 1 hr at 42°C at a z range of 2.5 μm. The white dotted squares indicated AFM height image analysis for the BS (A) and for part of the CS (A’). In (B & B’) are zoomed height images of these squares area (at z range of 200 nm). In (C & C’) are cross sections taken across the red lines, respectively in B and B’ respectively.